{"id":1029,"date":"2020-03-23T20:02:02","date_gmt":"2020-03-23T11:02:02","guid":{"rendered":"https:\/\/www.iee.jp\/ias\/?page_id=1029"},"modified":"2021-01-12T14:59:14","modified_gmt":"2021-01-12T05:59:14","slug":"recommendedarticle_iic","status":"publish","type":"page","link":"https:\/\/www.iee.jp\/ias\/recommendedarticle\/recommendedarticle_iic\/","title":{"rendered":"\u6ce8\u76ee\u8ad6\u6587\uff08\u7523\u696d\u8a08\u6e2c\u5236\u5fa1\u6280\u8853\uff09"},"content":{"rendered":"<table style=\"border-style: solid;border-color: #000000;width: 100%;height: 168px\" align=\"center\">\n<tbody>\n<tr style=\"height: 24px\">\n<th style=\"width: 10%;height: 24px\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td style=\"height: 24px\"><a href=\"https:\/\/doi.org\/10.1541\/ieejias.136.719\">\u81ea\u5f8b\u98db\u884c\u578b\u30c9\u30ed\u30fc\u30f3\u306e\u305f\u3081\u306eNeural Network \u3092\u7528\u3044\u305f3 \u6b21\u5143\u81ea\u7531\u8996\u70b9\u8a8d\u8b58\u30b7\u30b9\u30c6\u30e0\u306e\u69cb\u7bc9<br \/>\n<\/a><\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px\">\u8457\u8005<\/th>\n<td style=\"height: 24px\">\u65b0\u57a3\u9806\u4e5f\uff0c\u77f3\u5ddd\u4ec1\u53f2\uff0c\u9577\u5c71\u683c<\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"border-style: dashed;border-color: #000000;height: 24px\">\u5dfb\u53f7<\/th>\n<td style=\"height: 24px\">\u96fb\u5b66\u8ad6D, Vol. 136, No. 10, pp. 719\u2013726<\/td>\n<\/tr>\n<tr style=\"height: 96px\">\n<th style=\"height: 96px\">\u63a8\u85a6\u7406\u7531<\/th>\n<td style=\"height: 96px\">\n<p>\u3000\u672c\u8ad6\u6587\u3067\u306f\uff0c\u30cb\u30e5\u30fc\u30e9\u30eb\u30cd\u30c3\u30c8\u30ef\u30fc\u30af\u3092\u7528\u3044\u305f\u30c9\u30ed\u30fc\u30f3\u304b\u3089\u5f97\u3089\u308c\u308b\u4fef\u77b0\u8996\u70b9\u753b\u50cf\u304b\u3089\u306e\u81ea\u52d5\u8eca\u7a2e\u8a8d\u8b58\u30b7\u30b9\u30c6\u30e0\u3092\u63d0\u6848\u3057\u3066\u3044\u308b\u3002\u63d0\u6848\u624b\u6cd5\u3067\u306f\uff0c\u8eca\u4e21\u691c\u77e5\u306e\u305f\u3081\u306b\u7528\u3044\u3089\u308c\u308b\u5f93\u6765\u306e\u7279\u5fb4\u91cf\u306b\u52a0\u3048\u3066\uff0c\u5782\u76f4\u65b9\u5411\u3078\u306e\u5f62\u72b6\u5909\u5316\u3092\u3068\u3089\u3048\u308b\u305f\u3081\u306e\u65b0\u305f\u306a\u7279\u5fb4\u91cf\u3092\u5c0e\u5165\u3057\u3066\u3044\u308b\u3002\u691c\u8a3c\u5b9f\u9a13\u3067\u306f\uff0c3\u6b21\u5143CG\u3060\u3051\u3067\u306a\u304f\uff0c\u5b9f\u8eca\u4e21\u6a21\u578b\u753b\u50cf\uff0c\u3055\u3089\u306b\u305d\u308c\u306b\u30ce\u30a4\u30ba\u3092\u52a0\u3048\u305f\u753b\u50cf\u306e\u8b58\u5225\u5b9f\u9a13\u3092\u884c\u3063\u3066\u304a\u308a\uff0c\u3044\u305a\u308c\u3082\u5f93\u6765\u6cd5\u3088\u308a\u512a\u308c\u305f\u9ad8\u3044\u7cbe\u5ea6\u3067\u306e\u8b58\u5225\u306b\u6210\u529f\u3057\u3066\u3044\u308b\u3002<\/p>\n<p>\u3000\u30c9\u30ed\u30fc\u30f3\uff0c\u304a\u3088\u3073\u305d\u308c\u304b\u3089\u5f97\u3089\u308c\u308b\u753b\u50cf\u8a8d\u8b58\u3092\u6a5f\u68b0\u5b66\u7fd2\u6280\u8853\u3092\u7528\u3044\u3066\u884c\u3046\u624b\u6cd5\u3092\u63d0\u6848\u3057\u305f\u672c\u8ad6\u6587\u306f\uff0c\u6642\u5b9c\u3092\u5f97\u305f\u30c6\u30fc\u30de\u3092\u6271\u3063\u3066\u304a\u308a\uff0c\u5b9f\u9a13\u306b\u3088\u3063\u3066\u3082\u6709\u7528\u6027\u304c\u793a\u3055\u308c\u3066\u304a\u308a\uff0c\u6ce8\u76ee\u8ad6\u6587\u306b\u5024\u3059\u308b\u3068\u8003\u3048\u3089\u308c\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table style=\"border-style: solid;border-color: #000000;width: 100%;height: 168px\" align=\"center\">\n<tbody>\n<tr style=\"height: 24px\">\n<th style=\"width: 10%;height: 24px\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td style=\"height: 24px\"><a href=\"https:\/\/www.jstage.jst.go.jp\/article\/ieejjia\/6\/4\/6_295\/_article\">Failure Detection Method using Aggregated Vehicle Detector Data<\/a><\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px\">\u8457\u8005<\/th>\n<td style=\"height: 24px\">Koichiro Iwaoka, Yuzo Hirotsu<\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"border-style: dashed;border-color: #000000;height: 24px\">\u5dfb\u53f7<\/th>\n<td style=\"height: 24px\">\n<p>IEEJ Journal of Industry Applications, <span style=\"font-family: inherit;font-size: inherit\">Vol.6, No.4, pp.295-302, 2017<\/span><\/p>\n<\/td>\n<\/tr>\n<tr style=\"height: 96px\">\n<th style=\"height: 96px\">\u63a8\u85a6\u7406\u7531<\/th>\n<td style=\"height: 96px\">\u4ea4\u901a\u4fe1\u53f7\u5236\u5fa1\u3084\u4ea4\u901a\u4e88\u6e2c\u306a\u3069\u3092\u884c\u3046\u4ea4\u901a\u7ba1\u5236\u30b7\u30b9\u30c6\u30e0\u306b\u304a\u3044\u3066\uff0c\u8eca\u4e21\u611f\u77e5\u5668\u304c\u91cd\u8981\u306a\u5f79\u5272\u3092\u679c\u305f\u3057\u3066\u304a\u308a\uff0c\u65e5\u672c\u56fd\u5185\u306b\u591a\u6570\u8a2d\u7f6e\u3055\u308c\u3066\u3044\u308b\u3002\u73fe\u72b6\u3067\u306f\uff0c\u8001\u673d\u5316\u3057\u305f\u8eca\u4e21\u611f\u77e5\u5668\u3082\u591a\u6570\u3042\u308a\uff0c\u307e\u305f\u6545\u969c\u3082\u767a\u751f\u3059\u308b\u305f\u3081\uff0c\u30e1\u30f3\u30c6\u30ca\u30f3\u30b9\u3092\u884c\u3046\u5fc5\u8981\u304c\u3042\u308b\u304c\uff0c\u30b3\u30b9\u30c8\u9762\uff0c\u3042\u308b\u3044\u306f\u6545\u969c\u691c\u51fa\u81ea\u4f53\u306e\u96e3\u3057\u3055\u304b\u3089\u5bb9\u6613\u3067\u306f\u306a\u3044\uff0e\u672c\u8ad6\u6587\u3067\u306f\uff0c\u3053\u306e\u3088\u3046\u306a\u554f\u984c\u3092\u89e3\u6c7a\u3059\u308b\u305f\u3081\uff0c\u8eca\u4e21\u611f\u77e5\u5668\u304b\u3089\u5f97\u3089\u308c\u308b\u30c7\u30fc\u30bf\u3092\u96c6\u7d04\u3057\u305f\u60c5\u5831\u3092\u7528\u3044\u305f\u6545\u969c\u691c\u51fa\u624b\u6cd5\u3092\u63d0\u6848\u3057\uff0c\u5b9f\u74b0\u5883\u306b\u304a\u3051\u308b\u6709\u52b9\u6027\u3092\u78ba\u8a8d\u3057\u3066\u3044\u308b\u3002\u3053\u308c\u3089\u306e\u7406\u7531\u304b\u3089\uff0c\u672c\u8ad6\u6587\u306f\u7523\u696d\u5fdc\u7528\u4e0a\u306e\u8a3a\u65ad\u30fb\u76e3\u8996\u6280\u8853\u306e\u512a\u308c\u305f\u4e00\u4f8b\u3067\u3042\u308b\u305f\u3081\uff0c\u8a3a\u65ad\u30fb\u76e3\u8996\u306e\u57fa\u76e4\u6280\u8853\u3068\u305d\u306e\u5fdc\u7528\u306b\u95a2\u3059\u308b\u5354\u540c\u7814\u7a76\u59d4\u54e1\u4f1a\u304b\u3089\u6ce8\u76ee\u8ad6\u6587\u3068\u3057\u3066\u63a8\u85a6\u3059\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table style=\"border-style: solid;border-color: #000000;width: 100%;height: 168px\" align=\"center\">\n<tbody>\n<tr style=\"height: 24px\">\n<th style=\"width: 10%;height: 24px\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td style=\"height: 24px\"><a href=\"https:\/\/www.jstage.jst.go.jp\/article\/ieejias\/132\/6\/132_631\/_pdf\">\u5730\u4e2d\u30ec\u30fc\u30c0\u53d7\u4fe1\u4fe1\u53f7\u306e\u30ce\u30a4\u30ba\u89e3\u6790\u3068\u305d\u306e\u9664\u53bb\u624b\u6cd5<\/a><\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px\">\u8457\u8005<\/th>\n<td style=\"height: 24px\">Francesco Biral, Enrico Bertolazzi, and Paolo Bosetti<\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"border-style: dashed;border-color: #000000;height: 24px\">\u5dfb\u53f7<\/th>\n<td style=\"height: 24px\">\u96fb\u5b66\u8ad6D, Vol.132, No.6, pp.631-641 (2012)<\/td>\n<\/tr>\n<tr style=\"height: 96px\">\n<th style=\"height: 96px\">\u63a8\u85a6\u7406\u7531<\/th>\n<td style=\"height: 96px\">\u8eca\u9053\u3084\u6b69\u9053\u306a\u3069\uff0c\u8217\u88c5\u3055\u308c\u305f\u8def\u9762\u306e\u4e0b\u306b\u306f\uff0c\u6c34\u9053\u7ba1\u3084\u30ac\u30b9\u7ba1\u306a\u3069\u306e\u57cb\u8a2d\u7ba1\u304c\u3042\u308a\uff0c\u9053\u8def\u5de5\u4e8b\u306b\u304a\u3044\u3066\u306f\u3053\u308c\u3089\u3092\u7834\u640d\u3057\u306a\u3044\u3088\u3046\u306b\u6ce8\u610f\u3059\u308b\u5fc5\u8981\u304c\u3042\u308b\u3002\u3057\u304b\u3057\u306a\u304c\u3089\uff0c\u884c\u653f\u8cc7\u6599\u306b\u8a18\u8f09\u3055\u308c\u305f\u914d\u7f6e\u3068\u5b9f\u969b\u306e\u57cb\u8a2d\u7ba1\u306e\u914d\u7f6e\u304c\u7570\u306a\u3063\u3066\u3044\u308b\u5834\u5408\u304c\u591a\u304f\u5831\u544a\u3055\u308c\u3066\u3044\u308b\u3002\u672c\u8ad6\u6587\u3067\u306f\uff0c\u5730\u4e2d\u30ec\u30fc\u30c0\u306b\u3088\u3063\u3066\u5f97\u3089\u308c\u308b\u53d7\u4fe1\u4fe1\u53f7\u3092\u30a6\u30a7\u30fc\u30d6\u30ec\u30c3\u30c8\u89e3\u6790\u3057\uff0c\u89e3\u6790\u7d50\u679c\u304b\u3089\u30ce\u30a4\u30ba\u3092\u9664\u53bb\u3059\u308b\u65b9\u6cd5\u3092\u63d0\u6848\u3057\uff0c\u6709\u52b9\u6027\u3092\u691c\u8a3c\u3057\u3066\u3044\u308b\u3002\u672c\u8ad6\u6587\u3067\u63d0\u6848\u3055\u308c\u3066\u3044\u308b\u624b\u6cd5\u306f\uff0c\u57cb\u8a2d\u7ba1\u4f4d\u7f6e\u306e\u6a19\u5b9a\u3092\u7cbe\u5ea6\u826f\u304f\u884c\u3046\u305f\u3081\u306e\u524d\u51e6\u7406\u3068\u3057\u3066\u671f\u5f85\u3055\u308c\u3066\u304a\u308a\uff0c\u7523\u696d\u5fdc\u7528\u4e0a\u306e\u8a3a\u65ad\u30fb\u76e3\u8996\u6280\u8853\u306e\u512a\u308c\u305f\u4e00\u4f8b\u3067\u3042\u308b\u305f\u3081\uff0c\u8a3a\u65ad\u30fb\u76e3\u8996\u306e\u57fa\u76e4\u6280\u8853\u3068\u305d\u306e\u5fdc\u7528\u306b\u95a2\u3059\u308b\u5354\u540c\u7814\u7a76\u59d4\u54e1\u4f1a\u304b\u3089\u6ce8\u76ee\u8ad6\u6587\u3068\u3057\u3066\u63a8\u85a6\u3059\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table style=\"border-style: solid;border-color: #000000;width: 100%;height: 168px\" align=\"center\">\n<tbody>\n<tr style=\"height: 24px\">\n<th style=\"width: 10%;height: 24px\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td style=\"height: 24px\"><a href=\"https:\/\/www.jstage.jst.go.jp\/article\/ieejjia\/5\/2\/5_154\/_pdf\">Notes on Numerical Methods for Solving Optimal Control Problems<\/a><\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px\">\u8457\u8005<\/th>\n<td style=\"height: 24px\">Francesco Biral, Enrico Bertolazzi, and Paolo Bosetti<\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"border-style: dashed;border-color: #000000;height: 24px\">\u5dfb\u53f7<\/th>\n<td style=\"height: 24px\">IEEJ Journal of Industry Applications\uff0cVol. 5, No. 2, pp. 154-166, 2016<\/td>\n<\/tr>\n<tr style=\"height: 96px\">\n<th style=\"height: 96px\">\u63a8\u85a6\u7406\u7531<\/th>\n<td style=\"height: 96px\">\u73fe\u4ee3\u5236\u5fa1\u7406\u8ad6\u306e\u9ece\u660e\u671f\u306b\u7406\u8ad6\u6574\u5099\u304c\u9032\u3093\u3060\u6700\u9069\u5236\u5fa1\u7406\u8ad6\u306f, \u8fd1\u5e74\u306e\u8a08\u7b97\u6a5f\u6027\u80fd\u306e\u5411\u4e0a\u3068\u8a2d\u8a08\u30c4\u30fc\u30eb\u306e\u6574\u5099\u306b\u4f34\u3044, \u7523\u696d\u5fdc\u7528\u5206\u91ce\u306e\u591a\u304f\u306e\u5236\u5fa1\u5bfe\u8c61\u306b\u9069\u7528\u304c\u53ef\u80fd\u306b\u306a\u308a\u3064\u3064\u3042\u308b\u3002\u6700\u9069\u5236\u5fa1\u306f\u7279\u306b\u975e\u7dda\u5f62\u7cfb\u306b\u5bfe\u3057\u3066\u5927\u304d\u306a\u5a01\u529b\u3092\u767a\u63ee\u3059\u308b\u305f\u3081, \u5236\u5fa1\u5165\u529b\u3092\u5b9f\u6642\u9593\u3067\u89e3\u304f\u624b\u6cd5\u3082\u958b\u767a\u3055\u308c\u308b\u306a\u3069, \u8fd1\u5e74\u6d3b\u767a\u306b\u7814\u7a76\u304c\u9032\u3081\u3089\u308c\u3066\u3044\u308b\u3002\u672c\u8ad6\u6587\u3067\u306f, \u6700\u9069\u5236\u5fa1\u554f\u984c\u306e\u6570\u5024\u89e3\u6cd5\u306e\u6700\u65b0\u306e\u6210\u679c\u306b\u3064\u3044\u3066\u8a73\u8aac\u3057\u3066\u3044\u308b\u3002\u8457\u8005\u306e\u30a4\u30bf\u30ea\u30a2 \u30c8\u30ec\u30f3\u30c8\u5927\u5b66\u51c6\u6559\u6388Biral\u6c0f\u306f, \u7b2c1\u56deSAMCON2015\u306b\u3066\u30c1\u30e5\u30fc\u30c8\u30ea\u30a2\u30eb\u8b1b\u6f14\u3092\u52d9\u3081\u308b\u306a\u3069, \u3053\u306e\u5206\u91ce\u306e\u7b2c\u4e00\u7dda\u3067\u6d3b\u8e8d\u3059\u308b\u82e5\u624b\u7814\u7a76\u8005\u3067\u3042\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table style=\"height: 168px;border-style: solid;border-color: #000000\" align=\"center\">\n<tbody>\n<tr style=\"height: 24px\">\n<th style=\"width: 133px;height: 24px\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td style=\"height: 24px;width: 1230px\"><a href=\"https:\/\/www.jstage.jst.go.jp\/article\/ieejjia\/5\/2\/5_90\/_pdf\">Variable Gain Motion Control of Wafer Scanners<\/a><\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px;width: 133px\">\u8457\u8005<\/th>\n<td style=\"height: 24px;width: 1230px\">Marcel F. Heertjes<\/td>\n<\/tr>\n<tr style=\"height: 24px\">\n<th style=\"height: 24px;width: 133px\">\u5dfb\u53f7<\/th>\n<td style=\"height: 24px;width: 1230px\">IEEJ Journal of Industry Applications\uff0cVol. 5, No. 2, pp. 90-100, 2016<\/td>\n<\/tr>\n<tr style=\"height: 96px\">\n<th style=\"height: 96px;width: 133px\">\u63a8\u85a6\u7406\u7531<\/th>\n<td style=\"height: 96px;width: 1230px;border-style: dashed;border-color: #000000\">IC\u306e\u88fd\u9020\u306b\u7528\u3044\u3089\u308c\u308b\u534a\u5c0e\u4f53\u9732\u5149\u88c5\u7f6e\u306f, \u6700\u3082\u9ad8\u984d\u3067\u6700\u3082\u7cbe\u5bc6\u306a\u5236\u5fa1\u88c5\u7f6e\u3068\u8a00\u308f\u308c\u3066\u3044\u308b\u3002\u30ec\u30c1\u30af\u30eb\uff08\u30de\u30b9\u30af\uff09\u306b\u63cf\u304b\u308c\u305f\u96fb\u5b50\u56de\u8def\u306e\u30d1\u30bf\u30fc\u30f3\u3092\u5149\u5b66\u7cfb\u3067\u7e2e\u5c0f\u3057, \u30a6\u30a8\u30cf\u306b\u713c\u304d\u4ed8\u3051\u308b\u30a6\u30a7\u30cf\u30b9\u30ad\u30e3\u30ca\u3067\u306f, \u30ca\u30ce\u30e1\u30fc\u30c8\u30eb\u30aa\u30fc\u30c0\u30fc\u306e\u4f4d\u7f6e\u6c7a\u3081\u7cbe\u5ea6\u304c\u8981\u6c42\u3055\u308c\u308b\u3002\u672c\u8ad6\u6587\u3067\u306f\u53ef\u5909\u30b2\u30a4\u30f3\u5236\u5fa1\u306b\u3088\u308b\u30a6\u30a7\u30cf\u30b9\u30ad\u30e3\u30ca\u306e\u4f4d\u7f6e\u6c7a\u3081\u5236\u5fa1\u306e\u6700\u65b0\u306e\u6210\u679c\u306b\u3064\u3044\u3066\u8a73\u8aac\u3057\u3066\u3044\u308b\u3002\u8457\u8005\u306e\u30aa\u30e9\u30f3\u30c0 \u30a2\u30a4\u30f3\u30c8\u30db\u30fc\u30d5\u30a7\u30f3\u5de5\u79d1\u5927\u5b66\u51c6\u6559\u6388Heertjes\u6c0f\u306f, \u534a\u5c0e\u4f53\u9732\u5149\u88c5\u7f6e\u6700\u5927\u624b\u306eASML\u306e\u4e3b\u4efb\u6280\u8853\u8005\u3067\u3082\u3042\u308a, \u7b2c1\u56deSAMCON2015\u306b\u3066\u30c1\u30e5\u30fc\u30c8\u30ea\u30a2\u30eb\u8b1b\u6f14\u3092\u52d9\u3081\u308b\u306a\u3069, \u3053\u306e\u5206\u91ce\u306e\u7b2c\u4e00\u7dda\u3067\u6d3b\u8e8d\u3059\u308b\u82e5\u624b\u7814\u7a76\u8005\u3067\u3042\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<hr \/>\n<table style=\"border-style: solid;border-color: #000000\" align=\"center\">\n<tbody>\n<tr>\n<th style=\"width: 10%\">\u30bf\u30a4\u30c8\u30eb<\/th>\n<td><a href=\"https:\/\/www.jstage.jst.go.jp\/article\/ieejjia\/5\/2\/5_78\/_pdf\">Use of MEMS Inertial Sensors for Performance Improvement of Low-cost Motion Control Systems<\/a><\/td>\n<\/tr>\n<tr>\n<th>\u8457\u8005<\/th>\n<td>Roberto Oboe, Riccardo Antonello, Davide Pilastro, and Kazuaki Ito<\/td>\n<\/tr>\n<tr>\n<th>\u5dfb\u53f7<\/th>\n<td style=\"border-style: dashed;border-color: #000000\">IEEJ Journal of Industry Applications\uff0cVol. 5, No. 2, pp. 78-89, 2016<\/td>\n<\/tr>\n<tr>\n<th>\u63a8\u85a6\u7406\u7531<\/th>\n<td>\u8fd1\u5e74, \u52a0\u901f\u5ea6\u30bb\u30f3\u30b5\u3084\u30b8\u30e3\u30a4\u30ed\u30bb\u30f3\u30b5\u306a\u3069\u5b89\u4fa1\u306aMEMS\u30bb\u30f3\u30b5\u3092\u7528\u3044\u3066\u30e2\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c8\u30ed\u30fc\u30eb\u306e\u6027\u80fd\u3092\u98db\u8e8d\u7684\u306b\u5411\u4e0a\u3055\u305b\u308b\u6280\u8853\u304c\u6d3b\u767a\u306b\u7814\u7a76\u958b\u767a\u3055\u308c\u3066\u3044\u308b\u3002\u672c\u8ad6\u6587\u3067\u306f, MEMS\u6163\u6027\u30bb\u30f3\u30b5\u3092\u7528\u3044\u305f\u30e2\u30fc\u30b7\u30e7\u30f3\u30b3\u30f3\u30c8\u30ed\u30fc\u30eb\u306e\u6700\u65b0\u306e\u6210\u679c\u306b\u3064\u3044\u3066\u8a73\u8aac\u3057\u3066\u3044\u308b\u3002\u8457\u8005\u306e\u30a4\u30bf\u30ea\u30a2 \u30d1\u30c9\u30d0\u5927\u5b66\u51c6\u6559\u6388Oboe\u6c0f\u306f, IEEE Industrial Electronics Society \u526f\u4f1a\u9577\u3067, \u7b2c1\u56deSAMCON2015\u306b\u3066\u57fa\u8abf\u8b1b\u6f14\u3092\u52d9\u3081\u308b\u306a\u3069, \u3053\u306e\u5206\u91ce\u306e\u7b2c\u4e00\u7dda\u3067\u6d3b\u8e8d\u3059\u308b\u7814\u7a76\u8005\u3067\u3042\u308b\u3002<\/td>\n<\/tr>\n<\/tbody>\n<\/table>\n<p>&nbsp;<\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u30bf\u30a4\u30c8\u30eb \u81ea\u5f8b\u98db\u884c\u578b\u30c9\u30ed\u30fc\u30f3\u306e\u305f\u3081\u306eNeural Network \u3092\u7528\u3044\u305f3 \u6b21\u5143\u81ea\u7531\u8996\u70b9\u8a8d\u8b58\u30b7\u30b9\u30c6\u30e0\u306e\u69cb\u7bc9 \u8457\u8005 \u65b0\u57a3\u9806\u4e5f\uff0c\u77f3\u5ddd\u4ec1\u53f2\uff0c\u9577\u5c71\u683c \u5dfb\u53f7 \u96fb\u5b66\u8ad6D, Vol. 136, No. 10, pp. 719\u2013726 [&hellip;]<\/p>\n","protected":false},"author":35,"featured_media":0,"parent":981,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"jetpack_post_was_ever_published":false},"class_list":["post-1029","page","type-page","status-publish","hentry"],"acf":[],"jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/PbExjQ-gB","jetpack-related-posts":[],"_links":{"self":[{"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/pages\/1029","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/users\/35"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/comments?post=1029"}],"version-history":[{"count":5,"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/pages\/1029\/revisions"}],"predecessor-version":[{"id":1759,"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/pages\/1029\/revisions\/1759"}],"up":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/pages\/981"}],"wp:attachment":[{"href":"https:\/\/www.iee.jp\/ias\/wp-json\/wp\/v2\/media?parent=1029"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}