{"id":722,"date":"2021-01-21T16:22:13","date_gmt":"2021-01-21T07:22:13","guid":{"rendered":"https:\/\/www.iee.jp\/jec\/?page_id=722"},"modified":"2025-08-27T10:12:22","modified_gmt":"2025-08-27T01:12:22","slug":"award","status":"publish","type":"page","link":"https:\/\/www.iee.jp\/jec\/about\/award\/","title":{"rendered":"\u8868\u5f70"},"content":{"rendered":"<p><TABLE class=\"p-table p-table-base1\"><br \/>\n<TBODY><br \/>\n  <TR><br \/>\n    <TH rowspan=\"2\">\u96fb\u6c17\u898f\u683c\u8abf\u67fb\u4f1a<\/TH><br \/>\n    <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/honorary\/\" rel=\"noopener noreferrer\">\u540d\u8a89\u59d4\u54e1<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n    <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/achievement\/\" rel=\"noopener noreferrer\">\u529f\u7e3e\u8cde\u30fb\u529f\u52b4\u8cde<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n      <TH rowspan=\"3\">IEC<\/TH><br \/>\n      <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/ieckelvin\/\" rel=\"noopener noreferrer\">\uff08\u30ed\u30fc\u30c9\uff09\u30b1\u30eb\u30d3\u30f3\u8cde<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n      <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/iecedison\/\" rel=\"noopener noreferrer\">\u30c8\u30fc\u30de\u30b9\u30fb\u30a8\u30b8\u30bd\u30f3\u8cde<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n      <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/iec1906\/\" rel=\"noopener noreferrer\">1906\u8cde<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n    <TH>\u7d4c\u6e08\u7523\u696d\u7701<\/TH><br \/>\n    <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/standardization\/\" rel=\"noopener noreferrer\">\u56fd\u969b\u6a19\u6e96\u5316\u8ca2\u732e\u8005\u3001\u56fd\u969b\u6a19\u6e96\u5316\u5968\u52b1\u8005\u53ca\u3073\u5de5\u696d\u6a19\u6e96\u5316\u529f\u52b4\u8005\u8868\u5f70\u7523\u696d\u6280\u8853\u74b0\u5883\u5c40\u9577\u8868\u5f70<\/a><\/TD><br \/>\n  <\/TR><br \/>\n  <TR><br \/>\n    <TH>IEC-APC<\/TH><br \/>\n    <TD><a class=\"p-link\" href=\"https:\/\/www.iee.jp\/jec\/about\/award\/iecapc\/\" rel=\"noopener noreferrer\">\u8b70\u9577\u8cde<\/a><\/TD><br \/>\n  <\/TR><br \/>\n<\/TBODY><br \/>\n<\/TABLE><\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u96fb\u6c17\u898f\u683c\u8abf\u67fb\u4f1a \u540d\u8a89\u59d4\u54e1 \u529f\u7e3e\u8cde\u30fb\u529f\u52b4\u8cde IEC \uff08\u30ed\u30fc\u30c9\uff09\u30b1\u30eb\u30d3\u30f3\u8cde \u30c8\u30fc\u30de\u30b9\u30fb\u30a8\u30b8\u30bd\u30f3\u8cde 1906\u8cde \u7d4c\u6e08\u7523\u696d\u7701 \u56fd\u969b\u6a19\u6e96\u5316\u8ca2\u732e\u8005\u3001\u56fd\u969b\u6a19\u6e96\u5316\u5968\u52b1\u8005\u53ca\u3073\u5de5\u696d\u6a19\u6e96\u5316\u529f\u52b4\u8005\u8868\u5f70\u7523\u696d\u6280\u8853\u74b0\u5883\u5c40\u9577\u8868\u5f70 IEC-APC \u8b70\u9577\u8cde<\/p>\n","protected":false},"author":3,"featured_media":0,"parent":118,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":{"_acf_changed":false,"jetpack_post_was_ever_published":false},"class_list":["post-722","page","type-page","status-publish","hentry"],"acf":[],"jetpack_sharing_enabled":true,"jetpack_shortlink":"https:\/\/wp.me\/PbExB5-bE","_links":{"self":[{"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/pages\/722","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/users\/3"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/comments?post=722"}],"version-history":[{"count":5,"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/pages\/722\/revisions"}],"predecessor-version":[{"id":1201,"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/pages\/722\/revisions\/1201"}],"up":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/pages\/118"}],"wp:attachment":[{"href":"https:\/\/www.iee.jp\/jec\/wp-json\/wp\/v2\/media?parent=722"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}