{"id":5482,"date":"2025-09-01T12:03:00","date_gmt":"2025-09-01T03:03:00","guid":{"rendered":"https:\/\/www.iee.jp\/pes\/?p=5482"},"modified":"2025-09-01T12:03:00","modified_gmt":"2025-09-01T03:03:00","slug":"termb_174","status":"publish","type":"post","link":"https:\/\/www.iee.jp\/pes\/termb_174\/","title":{"rendered":"\u7528\u8a9e\u89e3\u8aac\u3000\u7b2c174\u56de\u30c6\u30fc\u30de\uff1a\u77ed\u7d61\u5bb9\u91cf"},"content":{"rendered":"

\u5c0f\u51fa\u3000\u660e\u3014\u6771\u4eac\u96fb\u6a5f\u5927\u5b66\u3015<\/p>\n

1. \u306f\u3058\u3081\u306b<\/h2>\n

\u77ed\u7d61\u5bb9\u91cf(1)\uff08SCC\uff1aShort Circuit Capacity\uff09\u306f\uff0c\u906e\u65ad\u5668\u306e\u5bb9\u91cf\u3092\u898b\u7a4d\u3082\u308b\u969b\u306b\u91cd\u8981\u306a\u6307\u6a19\u3067\u306f\u3042\u308b\u304c\uff0c\u96fb\u529b\u7cfb\u7d71\u306e\u5f37\u5ea6\uff08System Strength\uff09\u304a\u3088\u3073\u96fb\u5727\u7dad\u6301\u80fd\u529b\u3092\u6e2c\u308b\u6307\u6a19\u3068\u3057\u3066\u3082\u6d3b\u7528\u3055\u308c\u3066\u3044\u308b\u3002\u7279\u306b\uff0c\u706b\u529b\u767a\u96fb\u6a5f\u306e\u4f11\u5ec3\u6b62\u304c\u9032\u5c55\u3057\uff0c\u77ed\u7d61\u5bb9\u91cf\u304c\u6e1b\u5c11\u3057\u305f\u96fb\u529b\u7cfb\u7d71\uff08\u7279\u306b\u77ed\u7d61\u5bb9\u91cf\u6bd4\u304c3 \u672a\u6e80\u306e\u5f31\u3044\u7cfb\u7d71\uff09\u3067\u306f\uff0c\u30a4\u30f3\u30d0\u30fc\u30bf\u9023\u7cfb\u3059\u308b\u96fb\u6e90\u3084\u8a2d\u5099\u3078\u306e\u5f71\u97ff\u304c\u61f8\u5ff5(2)(3)\u3055\u308c\u3066\u3044\u308b\u3002\u672c\u89e3\u8aac\u3067\u306f\uff0c\u77ed\u7d61\u5bb9\u91cf\u306b\u3064\u3044\u3066\u8aac\u660e\u5f8c\uff0c\u8fd1\u5e74\u6ce8\u76ee\u3055\u308c\u3066\u3044\u308b\u77ed\u7d61\u5bb9\u91cf\u6bd4\u306b\u3064\u3044\u3066\u3082\u89e3\u8aac\u3059\u308b\u3002<\/p>\n

2. \u77ed\u7d61\u5bb9\u91cf<\/h2>\n

\u77ed\u7d61\u5bb9\u91cfSCC [MVA] \u306f\uff0c(\uff11)\u5f0f\u306e\u4e09\u76f8\u77ed\u7d61\u6642\u306e\u4ea4\u6d41\u5206\u77ed\u7d61\u96fb\u6d41\u3092\u7528\u3044\u3066(\uff12)\u5f0f\u306e\u3088\u3046\u306b\u7b97\u51fa(1)\u3067\u304d\u308b\u3002
\n\"\"<\/p>\n

\u305f\u3060\u3057\uff0c<\/p>\n

\"\"<\/p>\n

3. \u77ed\u7d61\u5bb9\u91cf\u6bd4<\/h2>\n

(\uff13)\u5f0f\u306b\u793a\u3059\u3088\u3046\u306b\u30a4\u30f3\u30d0\u30fc\u30bf\u96fb\u6e90\u306e\u5b9a\u683c\u51fa\u529b\u3068\u77ed\u7d61\u5bb9\u91cf\u306e\u6bd4\u306f\uff0c\u77ed\u7d61\u5bb9\u91cf\u6bd4\uff08SCR\uff1aShort Circuit Ratio\uff09\u3068\u547c\u3070\u308c\u3066\u3044\u308b\u3002
\n\"\"
\n\u307e\u305f\uff0c(\uff13)\u5f0f\u306f\u5358\u4e00\u306e\u30a4\u30f3\u30d0\u30fc\u30bf\u96fb\u6e90\u3092\u5bfe\u8c61\u3068\u3057\u305f\u6307\u6a19\u3067\u3042\u308b\u304c\uff0c\u8907\u6570\u306e\u30a4\u30f3\u30d0\u30fc\u30bf\u96fb\u6e90\u3092\u8003\u616e\u3057\u305fSCR\uff08Equipment circuit-based SCR \u3084Weighted SCR\uff0cComposite SCR(3)\u306a\u3069\uff09\u3084\u7121\u52b9\u96fb\u529b\u5236\u5fa1\u91cf\u3092\u8003\u616e\u3057\u305fEffective SCR\uff08ESCR\uff09\u306a\u3069\uff0c(\uff13)\u5f0f\u3088\u308a\u3082\u5b9f\u614b\u3092\u53cd\u6620\u3057\u305fSCR \u3082\u7528\u3044\u3089\u308c\u3066\u3044\u308b\u3002\u7279\u306b\uff0c(\uff14)\u5f0f\u306b\u793a\u3059Effective SCR(4)\u306f\uff0c\u76f4\u6d41\u9ad8\u5727\u9001\u96fb\uff08HVDC\uff1aHigh Voltage Direct Current\uff09\u306b\u3068\u3063\u3066\u91cd\u8981\u306a\u6307\u6a19\u3068\u306a\u308b\u3002<\/p>\n

\"\"<\/p>\n

\u305f\u3060\u3057\uff0c<\/p>\n

\"\"
\n\u306a\u304a\uff0cSCR\uff0cESCR \u306e\u76ee\u5b89\u306f\u53c2\u8003\u6587\u732e\u306b\u3088\u3063\u3066\u7570\u306a\u308b\u304c\uff0c\u6587\u732e(\uff15)\u3067\u306f\u4e21\u8005\u3068\u3082\u306b\uff0c3 \u672a\u6e80\u306e\u5834\u5408\u306fLow\uff0c\u7279\u306b2 \u4ee5\u4e0b\u306fVery Low \u3068\u5206\u985e\u3055\u308c\u3066\u3044\u308b\u3002\u306a\u304a\uff0c\u3053\u306e\u3088\u3046\u306a\u77ed\u7d61\u5bb9\u91cf\u6bd4\u304c\u5c0f\u3055\u3044\u7cfb\u7d71\u306b\u30a4\u30f3\u30d0\u30fc\u30bf\u96fb\u6e90\u304c\u9023\u7cfb\u3057\u305f\u5834\u5408\uff0cPLL\uff08Phase Locked Loop\uff09\u306e\u5236\u5fa1\u304c\u51fa\u529b\u96fb\u6d41\u306e\u5f71\u97ff\u3092\u53d7\u3051\u3066\u4e0d\u5b89\u5b9a\u306b\u306a\u308b\u3053\u3068\u3084\uff0c\u52d5\u7684\u306a\u9ad8\u96fb\u5727\uff08Dynamic High Voltage\uff09\uff0c\u96fb\u5727\u4e0d\u5b89\u5b9a\u6027\uff0c\u9ad8\u8abf\u6ce2\u5171\u632f\uff0c\u96fb\u5727\u30d5\u30ea\u30c3\u30ab\u30fc\u767a\u751f\u306e\u30ea\u30b9\u30af\u304c\u4e0a\u6607\u3059\u308b(4)\u305f\u3081\u5bfe\u7b56\u304c\u5fc5\u8981\u3068\u306a\u308b\u3002<\/p>\n

\u6587\u732e<\/h2>\n

(\uff11) \u96fb\u6c17\u5b66\u4f1a\uff1a\u96fb\u6c17\u5de5\u5b66\u30cf\u30f3\u30c9\u30d6\u30c3\u30af (\u7b2c6 \u7248) (2001)
\n(\uff12) North American Electric Reliability Corporation: \u201cShort-Circuit Modeling and System Strength\u201d, White Paper (2018)
\n(\uff13) National Grid ESO : \u201cProvision of Short Circuit Level Data\u201d (2022)
\n(\uff14) P. Kunder : Power System Stability and Control, McGrawHill (2006)
\n(\uff15) American National Standard : \u201cIEEE Guide for Planning DC Links Terminating at AC Locations Having Low Short-Circuit Capacities\u201d, IEEE Std 1204-1997 (R2003) (2003)<\/p>\n

\u3010\u96fb\u6c17\u5b66\u4f1a\u8ad6\u6587\u8a8cB\uff0c145\u5dfb\uff0c9\u53f7\uff0c2025\u306b\u63b2\u8f09\u3011<\/h3>\n

\u7528\u8a9e\u89e3\u8aac\u306e\u307e\u3068\u3081\u30da\u30fc\u30b8<\/a><\/h2>\n","protected":false},"excerpt":{"rendered":"

\u5c0f\u51fa\u3000\u660e\u3014\u6771\u4eac\u96fb\u6a5f\u5927\u5b66\u3015 1. \u306f\u3058\u3081\u306b \u77ed\u7d61\u5bb9\u91cf(1)\uff08SCC\uff1aShort Circuit Capacity\uff09\u306f\uff0c\u906e\u65ad\u5668\u306e\u5bb9\u91cf\u3092\u898b\u7a4d\u3082\u308b\u969b\u306b\u91cd\u8981\u306a\u6307\u6a19\u3067\u306f\u3042\u308b\u304c\uff0c\u96fb\u529b\u7cfb\u7d71\u306e\u5f37\u5ea6\uff08System Strength\uff09\u304a\u3088\u3073\u96fb […]<\/p>\n","protected":false},"author":9,"featured_media":1470,"comment_status":"open","ping_status":"closed","sticky":false,"template":"","format":"standard","meta":{"_acf_changed":false,"advanced_seo_description":"","jetpack_seo_html_title":"","jetpack_seo_noindex":false,"jetpack_post_was_ever_published":false,"_jetpack_newsletter_access":"","_jetpack_dont_email_post_to_subs":false,"_jetpack_newsletter_tier_id":0,"_jetpack_memberships_contains_paywalled_content":false,"_jetpack_memberships_contains_paid_content":false,"jetpack_publicize_message":"\u96fb\u529b\u30fb\u30a8\u30cd\u30eb\u30ae\u30fc\u90e8\u9580\u306e\u300e\u7528\u8a9e\u89e3\u8aac\u300f\u3092\u66f4\u65b0\u3057\u307e\u3057\u305f\r\n\u7b2c174\u56de\u30c6\u30fc\u30de\uff1a\u77ed\u7d61\u5bb9\u91cf\r\n#\u96fb\u6c17\u5b66\u4f1a #\u96fb\u529b #\u30a8\u30cd\u30eb\u30ae\u30fc #\u96fb\u6c17","jetpack_publicize_feature_enabled":true,"jetpack_social_post_already_shared":true,"jetpack_social_options":{"image_generator_settings":{"template":"highway","default_image_id":0,"font":"","enabled":false},"version":2}},"categories":[1,2],"tags":[],"class_list":["post-5482","post","type-post","status-publish","format-standard","has-post-thumbnail","hentry","category-event","category-news"],"acf":[],"jetpack_publicize_connections":[],"jetpack_featured_media_url":"https:\/\/www.iee.jp\/pes\/wp-content\/uploads\/sites\/3\/2020\/08\/term-EC.png","jetpack-related-posts":[],"jetpack_shortlink":"https:\/\/wp.me\/pbuf8C-1qq","jetpack_sharing_enabled":true,"_links":{"self":[{"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/posts\/5482","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/posts"}],"about":[{"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/types\/post"}],"author":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/users\/9"}],"replies":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/comments?post=5482"}],"version-history":[{"count":5,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/posts\/5482\/revisions"}],"predecessor-version":[{"id":5514,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/posts\/5482\/revisions\/5514"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/media\/1470"}],"wp:attachment":[{"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/media?parent=5482"}],"wp:term":[{"taxonomy":"category","embeddable":true,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/categories?post=5482"},{"taxonomy":"post_tag","embeddable":true,"href":"https:\/\/www.iee.jp\/pes\/wp-json\/wp\/v2\/tags?post=5482"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}